Local charge neutgrality condition, Fermi level, and carrier compensation of CdTe polycrystalline thin film in CdS/CdTe solar CELLS

Ken Chin, Su Huai Wei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

In this paper we discuss the classification of localized intrinsic/impurity defect states in the band gap of semiconductors according to the charging and transition energy levels of the state being single or multiple, and according to the atomic configuration and formation of energy of the state being single or multiple. For semiconductors that have multi-level intrinsic/impurity defect states (such as Cd vacancies VCd (o/-) and V Cd (-/2-) in CdTe thin film), the general formulation of charge neutrality condition is given to determine the Fermi level and majority carrier density. For semiconductors that have multi-configuration intrinsic/impurity defect states (such as acceptor CuCdand donor Cui in CdTe), the concept of transformation of state and self-compensation is introduced and discussed. The effect of state transformation and self-compensation on charge neutrality condition, Fermi level, and majority carrier density is explored. Numerical examples are given for CdTe to illustrate the relevance and importance of multi-level and multi-configuration intrinsic/impurity defect states for understanding the performance of CdTe thin film photovoltaics (PV).

Original languageEnglish (US)
Title of host publicationProgram - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Pages878-884
Number of pages7
DOIs
StatePublished - Dec 20 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: Jun 20 2010Jun 25 2010

Other

Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
CountryUnited States
CityHonolulu, HI
Period6/20/106/25/10

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Fingerprint Dive into the research topics of 'Local charge neutgrality condition, Fermi level, and carrier compensation of CdTe polycrystalline thin film in CdS/CdTe solar CELLS'. Together they form a unique fingerprint.

Cite this