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Mechanisms of retention loss in Ge2Sb2Te 5-based phase-change memory
Y. H. Shih, J. Y. Wu, B. Rajendran, M. H. Lee, R. Cheek, M. Lamorey, M. Breitwisch, Y. Zhu, E. K. Lai, C. F. Chen, E. Stinzianni, A. Schrott, E. Joseph, R. Dasaka, S. Raoux, H. L. Lung, C. Lam
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
21
Scopus
citations