Mechanisms of retention loss in Ge2Sb2Te 5-based phase-change memory

Y. H. Shih, J. Y. Wu, B. Rajendran, M. H. Lee, R. Cheek, M. Lamorey, M. Breitwisch, Y. Zhu, E. K. Lai, C. F. Chen, E. Stinzianni, A. Schrott, E. Joseph, R. Dasaka, S. Raoux, H. L. Lung, C. Lam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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