Metal-oxide bilayer Raman scattering in SrTiO3 thin films

Vladimir I. Merkulov; Jon R. Fox; Hong Cheng Li; Weidong Si; A. A. Sirenko; X. X. Xi

doi:10.1063/1.121627

Metal-oxide bilayer Raman scattering in SrTiO₃ thin films

Vladimir I. Merkulov, Jon R. Fox, Hong Cheng Li, Weidong Si, A. A. Sirenko, X. X. Xi

Research output: Contribution to journal › Article › peer-review

42 Scopus citations

Abstract

We have used a metal-oxide bilayer Raman scattering technique to study lattice dynamics in SrTiO₃ thin films. The SrTiO₃ thin films were epitaxially grown on a conducting metal-oxide layer which reflects the exciting laser beam so that it does not enter the LaAlO₃ substrate. Raman scattering from the SrTiO₃ thin films was clearly observed, including the first-order Raman peaks forbidden by the cubic symmetry in single crystals. We suggest that strain exists in the films, which changes the crystal symmetry and will affect the dielectric properties of the SrTiO₃ thin films.

Original language	English (US)
Pages (from-to)	3291-3293
Number of pages	3
Journal	Applied Physics Letters
Volume	72
Issue number	25
DOIs	https://doi.org/10.1063/1.121627
State	Published - 1998
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.121627

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abstract = "We have used a metal-oxide bilayer Raman scattering technique to study lattice dynamics in SrTiO3 thin films. The SrTiO3 thin films were epitaxially grown on a conducting metal-oxide layer which reflects the exciting laser beam so that it does not enter the LaAlO3 substrate. Raman scattering from the SrTiO3 thin films was clearly observed, including the first-order Raman peaks forbidden by the cubic symmetry in single crystals. We suggest that strain exists in the films, which changes the crystal symmetry and will affect the dielectric properties of the SrTiO3 thin films.",

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doi = "10.1063/1.121627",

language = "English (US)",

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T1 - Metal-oxide bilayer Raman scattering in SrTiO3 thin films

AU - Merkulov, Vladimir I.

AU - Fox, Jon R.

AU - Li, Hong Cheng

AU - Si, Weidong

AU - Sirenko, A. A.

AU - Xi, X. X.

PY - 1998

Y1 - 1998

N2 - We have used a metal-oxide bilayer Raman scattering technique to study lattice dynamics in SrTiO3 thin films. The SrTiO3 thin films were epitaxially grown on a conducting metal-oxide layer which reflects the exciting laser beam so that it does not enter the LaAlO3 substrate. Raman scattering from the SrTiO3 thin films was clearly observed, including the first-order Raman peaks forbidden by the cubic symmetry in single crystals. We suggest that strain exists in the films, which changes the crystal symmetry and will affect the dielectric properties of the SrTiO3 thin films.

AB - We have used a metal-oxide bilayer Raman scattering technique to study lattice dynamics in SrTiO3 thin films. The SrTiO3 thin films were epitaxially grown on a conducting metal-oxide layer which reflects the exciting laser beam so that it does not enter the LaAlO3 substrate. Raman scattering from the SrTiO3 thin films was clearly observed, including the first-order Raman peaks forbidden by the cubic symmetry in single crystals. We suggest that strain exists in the films, which changes the crystal symmetry and will affect the dielectric properties of the SrTiO3 thin films.

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JF - Applied Physics Letters

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Metal-oxide bilayer Raman scattering in SrTiO₃ thin films

Abstract

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