Metal-oxide bilayer Raman scattering in SrTiO3 thin films

Vladimir I. Merkulov, Jon R. Fox, Hong Cheng Li, Weidong Si, A. A. Sirenko, X. X. Xi

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

We have used a metal-oxide bilayer Raman scattering technique to study lattice dynamics in SrTiO3 thin films. The SrTiO3 thin films were epitaxially grown on a conducting metal-oxide layer which reflects the exciting laser beam so that it does not enter the LaAlO3 substrate. Raman scattering from the SrTiO3 thin films was clearly observed, including the first-order Raman peaks forbidden by the cubic symmetry in single crystals. We suggest that strain exists in the films, which changes the crystal symmetry and will affect the dielectric properties of the SrTiO3 thin films.

Original languageEnglish (US)
Pages (from-to)3291-3293
Number of pages3
JournalApplied Physics Letters
Volume72
Issue number25
DOIs
StatePublished - Dec 1 1998
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Metal-oxide bilayer Raman scattering in SrTiO<sub>3</sub> thin films'. Together they form a unique fingerprint.

Cite this