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Metal-oxide-silicon diodes on deuterium-implanted silicon substrate
D. Misra
, R. K. Jarwal
Electrical and Computer Engineering
Research output
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Contribution to journal
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Article
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peer-review
5
Scopus citations
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Physics & Astronomy
damage
14%
degradation
15%
deuterium
96%
diodes
78%
dosage
13%
energy
12%
implantation
18%
ion implantation
19%
leakage
17%
metal oxide semiconductors
21%
metal oxides
100%
oxidation
15%
oxides
38%
semiconductor diodes
26%
silicon
55%
traps
31%