Micro- and nanoparticles self-assembly for virtually defect-free, adjustable monolayers

N. Aubry, P. Singh, M. Janjua, S. Nudurupati

Research output: Contribution to journalArticlepeer-review

77 Scopus citations

Abstract

As chips further shrink toward smaller scales, fabrication processes based on the self-assembly of individual particles into patterns or structures are often sought. One of the most popular techniques for two-dimensional assembly (self-assembled monolayers) is based on capillary forces acting on particles placed at a liquid interface. Capillarity-induced clustering, however, has several limitations: it applies to relatively large (radius > ≈10 μm) particles only, the clustering is usually non-defect-free and lacks long-range order, and the lattice spacing cannot be adjusted. The goal of the present article is to show that these shortcomings can be addressed by using an external electric field normal to the interface. The resulting self-assembly is capable of controlling the lattice spacing statically or dynamically, forming virtually defect-free monolayers, and manipulating a broad range of particle sizes and types including nanoparticles and electrically neutral particles.

Original languageEnglish (US)
Pages (from-to)3711-3714
Number of pages4
JournalProceedings of the National Academy of Sciences of the United States of America
Volume105
Issue number10
DOIs
StatePublished - Mar 25 2008

All Science Journal Classification (ASJC) codes

  • General

Keywords

  • Capillarity
  • Dipole-dipole interactions
  • Electrohydrodynamics
  • Nanocrystal
  • Nanotechnology

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