GaN-based 6-μm -wide ridge waveguides with InGaNGaN multiple-quantum- wells (MQWs) produced by metal organic vapor-phase epitaxy in the regime of selective-area growth have been studied with microbeam high angular resolution x-ray diffraction and reciprocal-space mapping. Variation of the strain from 0.9% to 1.05% and a factor of 3 for the thickness enhancement of the MQW period have been measured for different widths of the oxide mask surrounding the GaN-based ridges. Only when the trapezoidal shape of the ridge cross section is taken into account can the difference between the experimentally measured thickness enhancement and predictions of the long-range gas-phase diffusion model be reconciled.
|Original language||English (US)|
|Journal||Applied Physics Letters|
|State||Published - 2006|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)