Microstructural and magnetic characterization of ion-beam bombarded [Ni80Fe20-Cr]50 thin films
- Chao Zheng
- , Ko Wei Lin
- , Chi Hsin Liu
- , Hsun Feng Hsu
- , Chi Wah Leung
- , Wei Hsien Chen
- , Te Ho Wu
- , Ryan D. Desautels
- , Johan Van Lierop
- , Philip W.T. Pong
Research output: Contribution to journal › Article › peer-review
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