Modeling and simulation of emissivity of silicon-related materials and structures

Keyphrases

• Emissivity 100%
• Silica 33%
• Si-SiO2 33%
• Incidence Angle 33%
• Radiative Properties 33%
• Silicon Nitride 33%
• Transmittance 33%
• Low Temperature 16%
• Complex Structure 16%
• Ray Tracing 16%
• Wafer 16%
• Wavelength Range 16%
• Temperature-independent 16%
• Semi-empirical Model 16%
• Absorption Edge 16%
• Dopant Type 16%
• Semi-quantitative Approach 16%
• Matrix Method 16%
• Emittance 16%
• Doping Concentration 16%
• Substrate Effect 16%

Engineering

• Emissivity 100%
• Angle of Incidence 33%
• Limitations 16%
• Complex Structure 16%
• Low-Temperature 16%
• Dopants 16%
• Significant Change 16%
• Quantitative Approach 16%
• Matrix Method 16%
• Reflectance 16%
• Empirical Model 16%
• Absorption Edge 16%

Material Science

• Silicon 100%
• Doping (Additives) 25%
• Silicon Nitride 25%