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Module Level Weighted Random Patterns
Jacob Savir
Electrical and Computer Engineering
Research output
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Contribution to journal
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Article
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peer-review
1
Scopus citations
Overview
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Dive into the research topics of 'Module Level Weighted Random Patterns'. Together they form a unique fingerprint.
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Keyphrases
Self-testing
100%
Module Level
100%
Weighted Random Patterns
100%
Near-optimal
50%
Pattern Generator
50%
Hardware Overhead
50%
Multiple Input Signature Register
50%
Test Architecture
50%
Pseudo-random Pattern
50%
Weighted Pattern
50%
Weight Control
50%
Optimal Weights
50%
Control Function
50%
Scan Test
50%
Computer Science
Random Pattern
100%
Hardware Overhead
50%
Input Signature Register
50%
Control Function
50%