Multi-parameter segmentation of brain images

Atam P. Dhawan, Brian D'Alessandro

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recent advances in multi-parameter MR brain imaging has enabled multi-class tissue characterization for better quantitative analysis and understanding brain disorders and pathologies. This paper presents a maximum likelihood based method for multi-class segmentation that utilizes spatio-frequency features obtained from wavelet analysis along with the multi-parameter measurements. Results on MR brain images of a patient with stroke are presented.

Original languageEnglish (US)
Title of host publication2009 4th International IEEE/EMBS Conference on Neural Engineering, NER '09
Pages222-225
Number of pages4
DOIs
StatePublished - 2009
Event2009 4th International IEEE/EMBS Conference on Neural Engineering, NER '09 - Antalya, Turkey
Duration: Apr 29 2009May 2 2009

Publication series

Name2009 4th International IEEE/EMBS Conference on Neural Engineering, NER '09

Other

Other2009 4th International IEEE/EMBS Conference on Neural Engineering, NER '09
Country/TerritoryTurkey
CityAntalya
Period4/29/095/2/09

All Science Journal Classification (ASJC) codes

  • Clinical Neurology
  • General Neuroscience
  • Biomedical Engineering

Keywords

  • Brain image analysis
  • Multi-parameter segmentation
  • Tissue characterization

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