TY - GEN
T1 - Mutation-based graph inference for fault localization
AU - Musco, Vincenzo
AU - Monperrus, Martin
AU - Preux, Philippe
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/12/12
Y1 - 2016/12/12
N2 - We present a new fault localization algorithm, called Vautrin, built on an approximation of causality based on call graphs. The approximation of causality is done using software mutants. The key idea is that if a mutant is killed by a test, certain call graph edges within a path between the mutation point and the failing test are likely causal. We evaluate our approach on the fault localization benchmark by Steimann et al. totaling 5,836 faults. The causal graphs are extracted from 88,732 nodes connected by 119,531 edges. Vautrin improves the fault localization effectiveness for all subjects of the benchmark. Considering the wasted effort at the method level, a classical fault localization evaluation metric, the improvement ranges from 3% to 55%, with an average improvement of 14%.
AB - We present a new fault localization algorithm, called Vautrin, built on an approximation of causality based on call graphs. The approximation of causality is done using software mutants. The key idea is that if a mutant is killed by a test, certain call graph edges within a path between the mutation point and the failing test are likely causal. We evaluate our approach on the fault localization benchmark by Steimann et al. totaling 5,836 faults. The causal graphs are extracted from 88,732 nodes connected by 119,531 edges. Vautrin improves the fault localization effectiveness for all subjects of the benchmark. Considering the wasted effort at the method level, a classical fault localization evaluation metric, the improvement ranges from 3% to 55%, with an average improvement of 14%.
UR - http://www.scopus.com/inward/record.url?scp=85010807499&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85010807499&partnerID=8YFLogxK
U2 - 10.1109/SCAM.2016.24
DO - 10.1109/SCAM.2016.24
M3 - Conference contribution
AN - SCOPUS:85010807499
T3 - Proceedings - 2016 IEEE 16th International Working Conference on Source Code Analysis and Manipulation, SCAM 2016
SP - 97
EP - 106
BT - Proceedings - 2016 IEEE 16th International Working Conference on Source Code Analysis and Manipulation, SCAM 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2016
Y2 - 2 October 2016 through 3 October 2016
ER -