Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy

Le Wang, Haomin Wang, Martin Wagner, Yong Yan, Devon S. Jakob, Xiaoji G. Xu

Research output: Contribution to journalArticlepeer-review

70 Scopus citations

Abstract

Nondestructive chemical and mechanical measurements of materials with ~10-nm spatial resolution together with topography provide rich information on the compositions and organizations of heterogeneous materials and nanoscale objects. However, multimodal nanoscale correlations are difficult to achieve because of the limitation on spatial resolution of optical microscopy and constraints from instrumental complexities. We report a novel noninvasive spectroscopic scanning probe microscopy method—peak force infrared (PFIR) microscopy—that allows chemical imaging, collection of broadband infrared spectra, and mechanical mapping at a spatial resolution of 10 nm. In our technique, chemical absorption information is directly encoded in the withdraw curve of the peak force tapping cycle after illumination with synchronized infrared laser pulses in a simple apparatus. Nanoscale phase separation in block copolymers and inhomogeneity in CH3NH3PbBr3 perovskite crystals are studied with correlative infrared/mechanical nanoimaging. Furthermore, we show that the PFIR method is sensitive to the presence of surface phonon polaritons in boron nitride nanotubes. PFIR microscopy will provide a powerful analytical tool for explorations at the nanoscale across wide disciplines.

Original languageEnglish (US)
Article numbere1700255
JournalScience Advances
Volume3
Issue number6
DOIs
StatePublished - Jun 2017

All Science Journal Classification (ASJC) codes

  • General

Fingerprint

Dive into the research topics of 'Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy'. Together they form a unique fingerprint.

Cite this