Negative bias temperature instability in TIN/Hf-silicate based gate stacks

N. A. Chowdhury, D. Misra, N. Rahim

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Negative bias temperature instability in TIN/Hf-silicate based gate stacks'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds