Nondestructive mapping of chemical composition and structural qualities of group III-nitride nanowires using submicron beam synchrotron-based X-ray diffraction

P. L. Bonanno, S. Gautier, Y. El Gmili, T. Moudakir, A. A. Sirenko, A. Kazimirov, Z. H. Cai, J. Martin, W. H. Goh, A. Martinez, A. Ramdane, L. Le Gratiet, N. Maloufi, M. B. Assouar, A. Ougazzaden

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Chemical Compounds