Nonlinear optical properties of silicon nanoclusters made by laser ablation

E. Lalanne, H. Garcia, A. M. Johnson, S. Vijayalakshmi, H. Grebel

Research output: Contribution to conferencePaperpeer-review

Abstract

The nonlinear optical properties of the laser ablated silicon nanoclustered films were measured by Z-scan measurements. Measurements that was carried out with a 10-ns, frequency doubled, Q-switched Nd:YAG laser indicated that β(I0 = 3×104 W/cm2)≈0. The films showed a large nonlinear diffraction effect and underwent bleaching. To eliminate any nonlinear and to assess the time scales of this phenomena, the nonlinear absorption of laser ablated films were measured at different repetition rates. Combination of lowered repetition rates and ultrashort pulses allowed the access intensities several orders of magnitude higher than that obtained with nanosecond excitation and avoid thermal contributions to the nonlinearity.

Original languageEnglish (US)
Pages88-89
Number of pages2
StatePublished - Jan 1 1998
EventProceedings of the 1998 International Quantum Electronics Conference - San Francisco, CA, USA
Duration: May 3 1998May 8 1998

Other

OtherProceedings of the 1998 International Quantum Electronics Conference
CitySan Francisco, CA, USA
Period5/3/985/8/98

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Nonlinear optical properties of silicon nanoclusters made by laser ablation'. Together they form a unique fingerprint.

Cite this