We have fabricated InGaAs/InP based DHBTs for high speed circuit applications. A process involving both wet chemical and ECR plasma etching was developed. Carbon was employed as the p-type dopant of the base layer for excellent device stability. Both the emitter-base and base-collector regions were graded using quaternary InGaAsP alloys. The extrinsic emitter-base junction is buried for junction passivation to improve device reliability. The use of an InP collector structure with the graded region results in high breakdown voltages of 8-10 V, with no current blocking. The entire structure is encapsulated with spin-on-glass. These devices show no degradation in d.c. characteristics after operation at an emitter current density of 90 kA cm-2 and a collector bias, VCE, of 2 V at room temperature for over 500 h. Typical common emitter current gain was 50. An ft, of 80 and fmax of 155 GHz were achieved for 2 x 4 μm2 emitter size devices.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry