@inproceedings{3002a35eb86141ee97adeaa510ab9643,
title = "Observer-based test of analog linear time-inv ariant circuits",
abstract = "Observer-based test methodolo gy is proposed in this paper for detecting parametric faults in analo g linear time- invariant circuits. A Kalman filter is used to reduce the mea- surement noise. Experiments conducte don an analog circuit are used to test the viability of the test methodology. The paper also discusses some inherent limitations of analog test in gener al. We show that, in the analo gtest domain, a fault-fr ee parameter may mask the detection of a faulty param- eter. Moreover, one faulty parameter may mask the detection of another faulty parameter leaving them both undetected.",
author = "Zhen Guo and Jacob Savir",
note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002 ; Conference date: 29-01-2002 Through 31-01-2002",
year = "2002",
doi = "10.1109/DELTA.2002.994581",
language = "English (US)",
series = "Proceedings - 1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "13--17",
editor = "M. Renovell and S. Kajihara and S. Demidenko and I. Al-Bahadly",
booktitle = "Proceedings - 1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002",
address = "United States",
}