Observer-based test of analog linear time-inv ariant circuits

Zhen Guo, Jacob Savir

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Observer-based test methodolo gy is proposed in this paper for detecting parametric faults in analo g linear time- invariant circuits. A Kalman filter is used to reduce the mea- surement noise. Experiments conducte don an analog circuit are used to test the viability of the test methodology. The paper also discusses some inherent limitations of analog test in gener al. We show that, in the analo gtest domain, a fault-fr ee parameter may mask the detection of a faulty param- eter. Moreover, one faulty parameter may mask the detection of another faulty parameter leaving them both undetected.

Original languageEnglish (US)
Title of host publicationProceedings - 1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002
EditorsM. Renovell, S. Kajihara, S. Demidenko, I. Al-Bahadly
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages13-17
Number of pages5
ISBN (Electronic)0769514537, 9780769514536
DOIs
StatePublished - Jan 1 2002
Event1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002 - Christchurch, New Zealand
Duration: Jan 29 2002Jan 31 2002

Publication series

NameProceedings - 1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002

Other

Other1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002
CountryNew Zealand
CityChristchurch
Period1/29/021/31/02

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Computer Science Applications

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