On chip weighted random patterns

Research output: Contribution to journalConference articlepeer-review

12 Scopus citations

Abstract

This paper describes the design details, operation, cost, and performance of a distributed weighted pattern test approach at the chip level. The traditional LSSD SRLs are being replaced by WRP SRLs designed specifically to facilitate a weighted random pattern (WRP) test. A two-bit code is transmitted to each WRP SRL to determine its specific weight. The WRP test is then divided into groups, where each group is activated with a different set of weights. The weights are dynamically adjusted during the course of the test to `go after' the remaining untested faults. The cost and performance of this design system are explored on three pilot chips. Results of this experiment are provided in the paper.

Original languageEnglish (US)
Pages (from-to)344-352
Number of pages9
JournalProceedings of the Asian Test Symposium
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1997 6th Asian Test Symposium - Akita, Jpn
Duration: Nov 17 1997Nov 19 1997

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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