ON RANDOM PATTERN TEST LENGTH.

Jacob Savir, Paul H. Bardell

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Digest of Papers - International Test Conference
Publisher	IEEE
Pages	95-106
Number of pages	12
ISBN (Print)	0818605022
State	Published - 1983
Externally published	Yes

Name	Digest of Papers - International Test Conference

All Science Journal Classification (ASJC) codes

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title = "ON RANDOM PATTERN TEST LENGTH.",

author = "Jacob Savir and Bardell, {Paul H.}",

year = "1983",

language = "English (US)",

isbn = "0818605022",

series = "Digest of Papers - International Test Conference",

publisher = "IEEE",

pages = "95--106",

booktitle = "Digest of Papers - International Test Conference",

}

TY - GEN

T1 - ON RANDOM PATTERN TEST LENGTH.

AU - Savir, Jacob

AU - Bardell, Paul H.

PY - 1983

Y1 - 1983

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M3 - Conference contribution

AN - SCOPUS:0020930186

SN - 0818605022

T3 - Digest of Papers - International Test Conference

SP - 95

EP - 106

BT - Digest of Papers - International Test Conference

PB - IEEE

ER -