ON RANDOM PATTERN TEST LENGTH.

Jacob Savir, Paul H. Bardell

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Digest of Papers - International Test Conference
Publisher	IEEE
Pages	95-106
Number of pages	12
ISBN (Print)	0818605022
State	Published - Dec 1 1983
Externally published	Yes

All Science Journal Classification (ASJC) codes

@inproceedings{e7f4fd1c01c748fe9610fccf1180db39,

title = "ON RANDOM PATTERN TEST LENGTH.",

author = "Jacob Savir and Bardell, {Paul H.}",

year = "1983",

month = dec,

day = "1",

language = "English (US)",

isbn = "0818605022",

pages = "95--106",

booktitle = "Digest of Papers - International Test Conference",

publisher = "IEEE",

}

TY - GEN

T1 - ON RANDOM PATTERN TEST LENGTH.

AU - Savir, Jacob

AU - Bardell, Paul H.

PY - 1983/12/1

Y1 - 1983/12/1

UR - http://www.scopus.com/inward/record.url?scp=0020930186&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020930186&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0020930186

SN - 0818605022

SP - 95

EP - 106

BT - Digest of Papers - International Test Conference

PB - IEEE

ER -