ON RANDOM PATTERN TEST LENGTH.

Jacob Savir, Paul H. Bardell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations
Original languageEnglish (US)
Title of host publicationDigest of Papers - International Test Conference
PublisherIEEE
Pages95-106
Number of pages12
ISBN (Print)0818605022
StatePublished - Dec 1 1983
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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