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On test and characterization of analog linear time-invariant circuits using neural networks
Zhen Guo
, Xi Min Zhang
,
Jacob Savir
, Yun Qing Shi
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Conference article
›
peer-review
5
Scopus citations
Overview
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Dive into the research topics of 'On test and characterization of analog linear time-invariant circuits using neural networks'. Together they form a unique fingerprint.
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Engineering
Tasks
100%
Manufacturing Process
100%
Pattern Recognition
100%
Recognition Problem
100%
Analog Circuit
100%
Delay Time
100%
Linear Time Invariant
100%
Keyphrases
Neural Network
100%
Linear Time Invariant
100%
Manufacturing Process
33%
Temporal Features
33%
Pattern Classification Problem
33%
Analog Circuits
33%
Amplitude Characteristics
33%
Delayed Neural Networks
33%
Computer Science
Neural Network
100%
Pattern Recognition
25%
Recognition Problem
25%
time-delay
25%
Analog Circuit
25%
Temporal Characteristic
25%
Neuroscience
Neural Network
100%
Pattern Recognition
25%