On the detectability of parametric faults in analog circuits

Jacob Savir, Zhen Guo

Research output: Contribution to conferencePaperpeer-review

16 Scopus citations

Abstract

This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.

Original languageEnglish (US)
Pages273-276
Number of pages4
StatePublished - Jan 1 2002
EventInternational Conference on Computer Design (ICCD'02) VLSI in Copmuters and Processors - Freiburg, Germany
Duration: Sep 16 2002Sep 18 2002

Other

OtherInternational Conference on Computer Design (ICCD'02) VLSI in Copmuters and Processors
Country/TerritoryGermany
CityFreiburg
Period9/16/029/18/02

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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