Abstract
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
| Original language | English (US) |
|---|---|
| Pages | 273-276 |
| Number of pages | 4 |
| State | Published - 2002 |
| Event | International Conference on Computer Design (ICCD'02) VLSI in Copmuters and Processors - Freiburg, Germany Duration: Sep 16 2002 → Sep 18 2002 |
Other
| Other | International Conference on Computer Design (ICCD'02) VLSI in Copmuters and Processors |
|---|---|
| Country/Territory | Germany |
| City | Freiburg |
| Period | 9/16/02 → 9/18/02 |
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering
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