On the dynamic resistance and reliability of phase change memory

B. Rajendran, M. H. Lee, M. Breitwisch, G. W. Burr, Y. H. Shih, R. Cheek, A. Schrott, C. F. Chen, M. Lamorey, E. Joseph, Y. Zhu, R. Dasaka, P. L. Flait, F. H. Baumann, H. L. Lung, C. Lam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

24 Scopus citations

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Engineering & Materials Science