Optical and microstructural characterization of nanocrystalline silicon superlattices

L. Tsybeskov, G. F. Grom, R. Krishnan, P. M. Fauchet, J. P. McCaffrey, J. M. Baribeau, G. I. Sproule, D. J. Lockwood, V. Timoshenko, J. Diener, H. Heckler, D. Kovalev, F. Koch, T. N. Blanton

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