Optical and microstructural characterization of nanocrystalline silicon superlattices

L. Tsybeskov, G. F. Grom, R. Krishnan, P. M. Fauchet, J. P. McCaffrey, J. M. Baribeau, G. I. Sproule, D. J. Lockwood, V. Timoshenko, J. Diener, H. Heckler, D. Kovalev, F. Koch, T. N. Blanton

Research output: Contribution to journal › Conference article › peer-review