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Optical and structural characterization of nc-Si/a-SiO
2
superlattices
G. Grom
,
L. Tsybeskov
, K. D. Hirschman
, P. M. Fauchet
, M. Zacharias
, T. N. Blanton
, J. P. McCaffrey
, J. M. Baribeau
, G. I. Sproule
, H. J. Labbe
, D. J. Lockwood
Research output
:
Contribution to journal
›
Conference article
›
peer-review
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2
superlattices'. Together they form a unique fingerprint.
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Keyphrases
Structural Characterization
100%
Raman Spectroscopy
100%
Optical Characterization
100%
Silica
100%
Nanocrystalline Si
100%
Superlattices
100%
Transmission Electron Microscopy
66%
Defect Density
33%
Si Nanocrystals
33%
Annealing
33%
Si-SiO2
33%
Optical Phonons
33%
Acoustic Phonons
33%
High-temperature Annealing
33%
Growth Direction
33%
Elemental Analysis
33%
Recrystallized
33%
Surface Reconstruction
33%
Wet Thermal Oxidation
33%
Bond Rearrangement
33%
Surface Defect Passivation
33%
Optical Reflection Spectroscopy
33%
Under High Temperature
33%
Material Science
Raman Spectroscopy
100%
Superlattice
100%
Nanocrystalline
100%
Transmission Electron Microscopy
66%
Defect Density
33%
Surface Reconstruction
33%
Surface Defect
33%
Nanocrystals
33%
Acoustics
33%
Defect Passivation
33%