Skip to main navigation
Skip to search
Skip to main content
New Jersey Institute of Technology Home
Help & FAQ
Home
Profiles
Research units
Equipment
Projects
Research output
Search by expertise, name or affiliation
Optical Constants of Silicon by Unpolarized Incident Radiation
O. L. Russo
Physics
Research output
:
Contribution to journal
›
Article
›
peer-review
4
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Optical Constants of Silicon by Unpolarized Incident Radiation'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering & Materials Science
Optical constants
100%
Optical transitions
58%
Conduction bands
47%
Radiation
43%
Silicon
43%
Refractive index
36%
Boron
31%
Impurities
26%
Wavelength
24%
Chemical Compounds
Optical Constant
80%
Wave
51%
Acceptor Level
45%
Optical Transition
38%
Visible Spectrum
32%
Conduction Band
29%
Refractive Index
26%
Error
20%
Wavelength
19%