Abstract
Si(bzimpy)2, a fluorescent organic complex, has been demonstrated as a potential electron transport and electroluminescent layer for organic electronic devices. Despite the successful synthesis and encouraging electroluminescence at 560 nm, the complex dielectric function of the water-stable complex has not been reported yet. In this letter, we report on the first spectroscopic ellipsometry data obtained from a Si(bzimpy)2 thin film in the spectral range from 300 nm to 1900 nm (0.65 eV to 4.1 eV). A parameterized model dielectric function composed of a Tauc-Lorentz and Gaussian oscillators is employed to analyze the experimental ellipsometry data. We find a good agreement between the absorption energies observed experimentally here and density functional theory calculations reported earlier.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 3469-3475 |
| Number of pages | 7 |
| Journal | Optical Materials Express |
| Volume | 9 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 1 2019 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
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