Abstract
Detailed Raman and photoluminescence (PL) measurements are reported for Si/Si1-xGex nanostructures grown by molecular beam epitaxy under near Stranski-Krastanov (S-K) growth mode conditions. In samples with x ranging from 0.096 to 0.53, we observe that an increase in the Raman signal related to Ge-Ge vibrations correlates with (i) a red shift in the PL peak position, (ii) an increase in the activation energy of PL thermal quenching, and (iii) an increase in the PL quantum efficiency. The results indicate that for x>0.5 Ge atoms form nanometer size clusters with a nearly pure Ge core surrounded by a SiGe shell. Time-resolved PL measurements reveal a stretched-exponential long-lived PL component that is associated with compositional and dimensional fluctuations in the SiGe dots.
Original language | English (US) |
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Pages (from-to) | 174-179 |
Number of pages | 6 |
Journal | Physica E: Low-Dimensional Systems and Nanostructures |
Volume | 26 |
Issue number | 1-4 |
DOIs | |
State | Published - Feb 2005 |
Event | International Conference on Quantum Dots - Banff, Alberta, Canada Duration: May 10 2004 → May 13 2004 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
Keywords
- Dots
- Nanocrystals
- Photoluminescence
- Raman scattering
- SiGe