Optically computed full field Doppler phase microscopy for dynamic imaging

Yuwei Liu, Shupei Yu, Yuanwei Zhang, Xuan Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

we investigate a full field Doppler phase microscopy (FF-DPM) technology based on an innovative optical computation strategy that enables depth resolved imaging and phase quantification. FF-DPM takes en face measurement of Doppler phase shift and quantitatively images the axial motion within the en face plane.

Original languageEnglish (US)
Title of host publication2023 Conference on Lasers and Electro-Optics, CLEO 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171258
StatePublished - 2023
Event2023 Conference on Lasers and Electro-Optics, CLEO 2023 - San Jose, United States
Duration: May 7 2023May 12 2023

Publication series

Name2023 Conference on Lasers and Electro-Optics, CLEO 2023

Conference

Conference2023 Conference on Lasers and Electro-Optics, CLEO 2023
Country/TerritoryUnited States
CitySan Jose
Period5/7/235/12/23

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Computer Science Applications
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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