OPTIMAL RANDOM TESTING OF SINGLE INTERMITTENT FAILURES IN COMBINATIONAL CIRCUITS.

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15 Scopus citations

Abstract

Because of the random nature of the appearance and disappearance of intermittent failures, their detection in combinational circuits requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to find an efficient way to reduce this time, and still achieve a high degree of detection. This paper presented an optimal algorithm to detect intermittent failures. The algorithm maximizes the probability of fault detection by optimally choosing the input vector probabilities.

Original languageEnglish (US)
Pages (from-to)180-185
Number of pages6
JournalProceedings - Annual International Conference on Fault-Tolerant Computing
StatePublished - Jan 1 1977
Externally publishedYes
EventProc Annu Int Conf Fault Tolerant Comput 7th - Los Angeles, CA, USA
Duration: Jun 28 1977Jun 30 1977

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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