Abstract
Because of the random nature of the appearance and disappearance of intermittent failures, their detection in combinational circuits requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to find an efficient way to reduce this time, and still achieve a high degree of detection. This paper presented an optimal algorithm to detect intermittent failures. The algorithm maximizes the probability of fault detection by optimally choosing the input vector probabilities.
Original language | English (US) |
---|---|
Pages (from-to) | 180-185 |
Number of pages | 6 |
Journal | Proceedings - Annual International Conference on Fault-Tolerant Computing |
State | Published - 1977 |
Externally published | Yes |
Event | Proc Annu Int Conf Fault Tolerant Comput 7th - Los Angeles, CA, USA Duration: Jun 28 1977 → Jun 30 1977 |
All Science Journal Classification (ASJC) codes
- Hardware and Architecture