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Oxygen ion implanted germanium - structural properties
N. M. Ravindra
, T. Fink
, W. Savin
, T. P. Sjoreen
, R. L. Pfeffer
, L. G. Yerke
, R. T. Lareau
, J. G. Gualtieri
, R. Lux
, C. Wrenn
Physics
Research output
:
Contribution to journal
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Article
›
peer-review
8
Scopus citations
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Keyphrases
Structural Properties
100%
Germanium
100%
Ion Implantation
100%
GeO2 Glass
100%
Oxygen Ions
100%
Optical Properties
50%
Rutherford Backscattering
50%
Secondary Ion Mass Spectrometry
50%
Liquid Nitrogen
50%
Measurement Techniques
50%
GeO2
50%
Different Substrate Temperature
50%
Electron Spin Resonance
50%
Material Science
Optical Property
100%
Powder
100%
Germanium
100%
Structural Property
100%
Ion Implantation
100%
Secondary Ion Mass Spectrometry
100%
Electron Paramagnetic Resonance Spectroscopy
100%
Chemistry
Structure
100%
Germanium
100%
Oxygen Ion
100%
Optical Property
50%
Purity
50%
Secondary Ion Mass Spectroscopy
50%
Ion Implantation
50%
Rutherford Backscattering Spectroscopy
50%
Electron Spin
50%
Biochemistry, Genetics and Molecular Biology
Optics
100%
Melting Point
100%
Electron Paramagnetic Resonance Spectroscopy
100%
Powder
100%
Secondary Ion Mass Spectrometry
100%