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Oxygen-stoichiometry-dependent microstructural and magnetic properties of CoPt thin films capped with ion-beam-assisted deposited TiO
x
layers
Guijun Li
, Chi Wah Leung
, Chin Shueh
, Yi Jing Wu
, Ko Wei Lin
, An Cheng Sun
, Jen Hwa Hsu
, Pui To Lai
,
Philip W.T. Pong
Research output
:
Contribution to journal
›
Article
›
peer-review
4
Scopus citations
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Dive into the research topics of 'Oxygen-stoichiometry-dependent microstructural and magnetic properties of CoPt thin films capped with ion-beam-assisted deposited TiO
x
layers'. Together they form a unique fingerprint.
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Keyphrases
Magnetic Properties
100%
CoPt
100%
TiOx
100%
Oxygen Stoichiometry
100%
Microstructural Properties
100%
CoPt Thin Films
100%
Ion Beam Assisted
100%
Annealing
33%
Oxides
16%
Structural Phase Transition
16%
Coercivity
16%
Grain Boundary
16%
Magnetic Recording
16%
Annealing Process
16%
Capping Layer
16%
Post-annealing
16%
High Coercivity
16%
Oxygen Ratio
16%
Enhanced Coercivity
16%
Engineering
Thin Films
100%
Coercivity
100%
Grain Boundary
33%
Face-Centered Cubic
33%
Annealing Process
33%
Capping Layer
33%
Magnetic Recording
33%
Excess Amount
33%
Material Science
Thin Films
100%
Magnetic Property
100%
Oxide Compound
50%
Annealing
50%
Grain Boundary
50%