Abstract
This article shows the applications of ultrafast light in studying material optical properties and its application for rudimental imaging. Standard methods, when applied to the imaging, can not independently determine the material's thickness and index of refraction. The proposed method is fundamentally different from other imaging such as contrast difference in optical coherent tomography (OCT) or the peak-to-peak intensity ratio as in THz imaging to determine index of refraction and thickness. We show that the application of ultrafast techniques allows simultaneous measurements of material thickness and optical constants in optical precision from transmission measurements. Such finding invites new perspectives in imaging and other applicable disciplines.
Original language | English (US) |
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Article number | 36 |
Pages (from-to) | 411-420 |
Number of pages | 10 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5647 |
DOIs | |
State | Published - 2005 |
Event | 36th Annual Boulder Damage Symposium Proceedings: Laser-Induced Damage in Optical Materials: 2004 - Boulder, CO, United States Duration: Sep 20 2004 → Sep 22 2004 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Applied Mathematics
- Electrical and Electronic Engineering
- Computer Science Applications
Keywords
- Echo analysis
- LT GaAs
- Physical imaging
- THz
- Time Domain spectroscopy