Physical imaging of void using ultrafast light in optical precision

Research output: Contribution to journalArticlepeer-review


This article shows the applications of ultrafast light in studying material optical properties and its application for rudimental imaging. Standard methods, when applied to the imaging, can not independently determine the material's thickness and index of refraction. The proposed method is fundamentally different from other imaging such as contrast difference in optical coherent tomography (OCT) or the peak-to-peak intensity ratio as in THz imaging to determine index of refraction and thickness. We show that the application of ultrafast techniques allows simultaneous measurements of material thickness and optical constants in optical precision from transmission measurements. Such finding invites new perspectives in imaging and other applicable disciplines.

Original languageEnglish (US)
Article number36
Pages (from-to)411-420
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - May 27 2005

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


Dive into the research topics of 'Physical imaging of void using ultrafast light in optical precision'. Together they form a unique fingerprint.

Cite this