Mathematics
Spectroscopic Ellipsometry
100%
SiO2
81%
Integrated Circuits
73%
Reflectance
72%
Electrolyte
69%
Thin Films
62%
Transmission Electron Microscopy
43%
Experimental Study
31%
High Resolution
30%
Wavelength
28%
Voltage
28%
Breakdown
26%
Characterization
26%
Electron
25%
Energy
16%
Range of data
15%
Model
8%
Engineering & Materials Science
Spectroscopic ellipsometry
90%
Electrolytes
48%
Thin films
47%
Integrated circuits
46%
High resolution transmission electron microscopy
40%
Electric breakdown
28%
Electrons
25%
Wavelength
21%
Characterization (materials science)
21%
Temperature
9%
Physics & Astronomy
ellipsometry
48%
integrated circuits
47%
electrolytes
41%
reflectance
35%
characterization
27%
thin films
25%
free electrons
24%
electrical faults
24%
transmission electron microscopy
16%
high resolution
15%
wavelengths
11%
energy
7%
Chemical Compounds
Ellipsometry
54%
Breakdown Voltage
37%
Free Electron
31%
Liquid Film
24%
Wavelength
17%
Energy
11%