Mathematics
Breakdown
26%
Characterization
26%
Electrolyte
69%
Electron
25%
Energy
16%
Experimental Study
31%
High Resolution
30%
Integrated Circuits
73%
Model
8%
Range of data
15%
Reflectance
72%
SiO2
81%
Spectroscopic Ellipsometry
100%
Thin Films
62%
Transmission Electron Microscopy
43%
Voltage
28%
Wavelength
28%
Engineering & Materials Science
Characterization (materials science)
21%
Electric breakdown
28%
Electrolytes
48%
Electrons
25%
High resolution transmission electron microscopy
40%
Integrated circuits
46%
Spectroscopic ellipsometry
90%
Temperature
9%
Thin films
47%
Wavelength
21%
Physics & Astronomy
characterization
27%
electrical faults
24%
electrolytes
41%
ellipsometry
48%
energy
7%
free electrons
24%
high resolution
15%
integrated circuits
47%
reflectance
35%
thin films
25%
transmission electron microscopy
16%
wavelengths
11%
Chemical Compounds
Breakdown Voltage
37%
Ellipsometry
54%
Energy
11%
Free Electron
31%
Liquid Film
24%
Wavelength
17%