Progress on the development of multiwavelength imaging pyrometer

Michael B. Kaplinsky, Jun Li, Nathaniel J. McCaffrey, Sui-Hoi Hou, Walter F. Kosonocky

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Experimental Multi-wavelength Imaging Pyrometer (M-WIP) is presented for remote sensing of temperature profiles of targets with unknown spectrally varying emissivity. A software package was developed for calibration and real-time M-WIP measurements. An experimental 7-filter line-sensing M- WIP system was implemented with a 320 × 122-element PtSi IR-CCD imager and an assembly of narrow-band striped IR filters in the spectral range from 1797 nm through 4512 nm. The M-WIP system was calibrated against a commercial blackbody source over temperature range from 450°C to 950°C. The signal processing included background subtraction, compensation for variation of dark current with detected signal and correction for non-linearities of IR imager response. Initial M-WIP measurements demonstrated real-time temperature resolution ΔT of ±1°C for blackbody target over temperature range from 600°C to 900°C. Temperature resolution of ±4°C was demonstrated for the blackbody source viewed through the double polished silicon wafer with unknown spectral transmissivity in the temperature range from 500°C to 950°C.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsEustace L. Dereniak, Robert E. Sampson
Pages178-189
Number of pages12
StatePublished - Jan 1 1996
EventInfrared Detectors and Focal Plane Arrays IV - Orlando, FL, USA
Duration: Apr 10 1996Apr 11 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2746

Other

OtherInfrared Detectors and Focal Plane Arrays IV
CityOrlando, FL, USA
Period4/10/964/11/96

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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