@inproceedings{97119f1b61df49cda200bc5e331a3271,
title = "PyXRF: Python-based X-ray fluorescence analysis package",
abstract = "We developed a python-based fluorescence analysis package (PyXRF) at the National Synchrotron Light Source II (NSLS-II) for the X-ray fluorescence-microscopy beamlines, including Hard X-ray Nanoprobe (HXN), and Submicron Resolution X-ray Spectroscopy (SRX). This package contains a high-level fitting engine, a comprehensive commandline/ GUI design, rigorous physics calculations, and a visualization interface. PyXRF offers a method of automatically finding elements, so that users do not need to spend extra time selecting elements manually. Moreover, PyXRF provides a convenient and interactive way of adjusting fitting parameters with physical constraints. This will help us perform quantitative analysis, and find an appropriate initial guess for fitting. Furthermore, we also create an advanced mode for expert users to construct their own fitting strategies with a full control of each fitting parameter. PyXRF runs single-pixel fitting at a fast speed, which opens up the possibilities of viewing the results of fitting in real time during experiments. A convenient I/O interface was designed to obtain data directly from NSLS-II's experimental database. PyXRF is under open-source development and designed to be an integral part of NSLS-II's scientific computation library.",
keywords = "Quantitative analysis, X-ray fluorescence",
author = "Li Li and Hanfei Yan and Wei Xu and Dantong Yu and Annie Heroux and Lee, {Wah Keat} and Campbell, {Stuart I.} and Chu, {Yong S.}",
note = "Funding Information: This research used the Hard X-ray Nanoprobe (HXN) Beamline (3-ID) of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704. The authors acknowledge the support from all the group members at Data Acquisition, Management and Analysis group at NSLS-II of BNL. We especially thank Eric Dill, Kenneth Lauer, Thomas Caswell, Arman Arkilic and Daniel Allan for useful discussions on GUI development and data I/O. We thank Stefan Vogt at Advanced Photon Source of Argonne National Laboratory for fruitful discussions at the early stage of this project. We thank Yao Shun at Computational Science Initiative of BNL for contributions to this work. We also thank Garth Williams, Yu-chen Karen Chen-Wiegart and Juergen Thieme at SRX of NSLS-II for all the comments on, and suggestions for this work. We acknowledge Mingyuan Ge, Wen Hu, Xiaojing Huang and Sebastian Kalbfleisch for experimental support at the HXN beamline for producing the XRF maps used for this work. We are deeply grateful to Hirofumi Sumi and Toshio Suzuki from Materials and Chemistry Department at National Institute of Advanced Industrial Science and Technology in Japan for giving us permission to use their microscopy images of a Ni-GDC sample, taken at the HXN beamline of the NSLS-II. Publisher Copyright: {\textcopyright} 2017 SPIE.; X-Ray Nanoimaging: Instruments and Methods III 2017 ; Conference date: 07-08-2017 Through 08-08-2017",
year = "2017",
doi = "10.1117/12.2272585",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Andrea Somogyi and Barry Lai",
booktitle = "X-Ray Nanoimaging",
address = "United States",
}