Abstract
A RAM test scheme is described. The scheme can be used in both built-in mode and off-chip/module mode. Fault diagnosis is simple and never subjected to aliasing. Depending upon the test length, many kinds of failures can be detected, including stuck-cells, decoder faults, and shorts. Used in the built-in mode, the scheme does not slow down normal array operation and the hardware overhead is very low.
| Original language | English (US) |
|---|---|
| Pages | 204-211 |
| Number of pages | 8 |
| State | Published - 2000 |
| Event | IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' - Baltimore, MD, USA Duration: May 1 2000 → May 4 2000 |
Other
| Other | IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' |
|---|---|
| City | Baltimore, MD, USA |
| Period | 5/1/00 → 5/4/00 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering