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RAM BIST
Jacob Savir
Electrical and Computer Engineering
Research output
:
Contribution to conference
›
Paper
›
peer-review
2
Scopus citations
Overview
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Dive into the research topics of 'RAM BIST'. Together they form a unique fingerprint.
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Keyphrases
Fault Diagnosis
100%
Array Operations
100%
Decoder
100%
Hardware Overhead
100%
Built-in-self-test (BiST)
100%
Aliasing
100%
Chip Module
100%
Engineering
Built-in Self Test
100%
Reliability Availability and Maintainability (Reliability Engineering)
100%
Array Operation
50%
Fault Diagnosis
50%
Hardware Overhead
50%