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RAM BIST
Jacob Savir
Electrical and Computer Engineering
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peer-review
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Keyphrases
Random Access Memory
100%
Memory Built-in Self-test (MBIST)
100%
Testability Design
66%
Random Data
33%
Hardware Overhead
33%
Built-in-self-test (BiST)
33%
Linear Feedback Shift Register
33%
Memory Faults
33%