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Raman and optical spectroscopy of nanocrystalline silicon films
Z. Iqbal, S. Veprek
Research output
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Contribution to journal
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Article
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peer-review
4
Scopus citations
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Dive into the research topics of 'Raman and optical spectroscopy of nanocrystalline silicon films'. Together they form a unique fingerprint.
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Keyphrases
Raman Spectroscopy
100%
Optical Spectroscopy
100%
Nanocrystalline Silicon
100%
Grain Boundary Regions
100%
Nanocrystalline Silicon Film
100%
Light Scattering
50%
Raman Scattering
50%
Selenium
50%
Diffraction
50%
Compressive Stress
50%
Scattering Intensity
50%
Plasma-enhanced Chemical Vapor Deposition (PECVD)
50%
Grain Boundary
50%
Crystallites
50%
Raman Active Modes
50%
Intensity Enhancement
50%
Nanocrystalline
50%
Average Crystallite Size
50%
Boundary Mode
50%
Characteristic Variation
50%
Phonon Localization
50%
Crystallite Size Effect
50%
Scattering Enhancement
50%
Elastic Scattering
50%
Expanded Grain
50%
Optical Absorption Coefficient
50%
Material Science
Film
100%
Raman Spectroscopy
100%
Nanocrystalline Silicon
100%
Grain Boundary
100%
Optical Spectroscopy
100%
Crystallite Size
66%
Thin Films
33%
Silicon
33%
Nanocrystalline
33%
Linewidth
33%
Chemical Vapor Deposition
33%
Crystallite
33%