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Raman scattering from hydrogenated microcrystalline and amorphous silicon
Z. Iqbal, S. Veprek
Research output
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Contribution to journal
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Article
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peer-review
538
Scopus citations
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Dive into the research topics of 'Raman scattering from hydrogenated microcrystalline and amorphous silicon'. Together they form a unique fingerprint.
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Keyphrases
Amorphous Films
33%
Amorphous Silicon
33%
Amorphous-like
66%
Annealing Studies
33%
Compressive Stress
33%
Crystalline-amorphous
33%
Crystallite Size
33%
Crystallites
66%
Density of States
33%
Depolarization Ratio
33%
Deposition Temperature
33%
Finite Dimension
33%
Grain Boundary
33%
Hydrogen Plasma
33%
Hydrogenated Amorphous Silicon
100%
Hydrogenated Nanocrystalline Silicon
100%
Lattice Expansion
33%
Microcrystalline
33%
Negative Bias
33%
Raman Scattering
100%
Raman Spectra
66%
Scattering Measurements
33%
SiC Cluster
33%
X-ray Amorphous
66%
Material Science
Amorphous Film
33%
Amorphous Material
100%
Amorphous Silicon
100%
Crystalline Material
66%
Crystallite
66%
Crystallite Size
33%
Density
33%
Film
33%
Grain Boundary
33%
Microcrystalline Silicon
100%
Silicon
33%
Engineering
Compressive Stress
50%
Crystallite
100%
Crystallite Size
50%
Deposition Temperature
50%
Grain Boundary
50%
Microcrystalline
100%
Microcrystalline Silicon
50%
Raman Spectrum
100%
Physics
Amorphous Silicon
100%
Crystallite
60%
Density of States
20%
Grain Boundaries
20%
Hydrogen Plasma
20%
Raman Spectra
100%
Earth and Planetary Sciences
Amorphous Silicon
100%
Crystallite
60%
Grain Boundary
20%
Hydrogen Plasma
20%
Raman Spectra
100%