RANDOM PATTERN TESTABILITY.

J. Savir, G. Ditlow, P. H. Bardell

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
Publisher	IEEE
Pages	80-89
Number of pages	10
ISBN (Print)	0818600209
State	Published - 1983
Externally published	Yes

Name	Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN (Print)	0731-3071

All Science Journal Classification (ASJC) codes

@inproceedings{1741484695724955a3df9d254e8523e1,

title = "RANDOM PATTERN TESTABILITY.",

author = "J. Savir and G. Ditlow and Bardell, {P. H.}",

year = "1983",

language = "English (US)",

isbn = "0818600209",

series = "Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)",

publisher = "IEEE",

pages = "80--89",

booktitle = "Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)",

}

TY - GEN

T1 - RANDOM PATTERN TESTABILITY.

AU - Savir, J.

AU - Ditlow, G.

AU - Bardell, P. H.

PY - 1983

Y1 - 1983

UR - http://www.scopus.com/inward/record.url?scp=0020599151&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020599151&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0020599151

SN - 0818600209

T3 - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

SP - 80

EP - 89

BT - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

PB - IEEE

ER -