RANDOM PATTERN TESTABILITY.

J. Savir, G. Ditlow, P. H. Bardell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

24 Scopus citations
Original languageEnglish (US)
Title of host publicationDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
PublisherIEEE
Pages80-89
Number of pages10
ISBN (Print)0818600209
StatePublished - Jan 1 1983
Externally publishedYes

Publication series

NameDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN (Print)0731-3071

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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