Random Pattern Testability

Jacob Savir, Gary S. Ditlow, Paul H. Bardell

Research output: Contribution to journalArticlepeer-review

129 Scopus citations

Abstract

A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using full-fault simulation does not seem attractive because of the logic structure volume, and the CPU time encountered. A new approach is therefore necessary. This paper describes a new analytical method of computing the fault coverage that is fast compared with simulation. If the fault coverage falls below a certain threshold, it is possible to identify the “random-pattern-resistant” faults, modify the logic to make them easy to detect, and thus, increase the fault coverage of the random test.

Original languageEnglish (US)
Pages (from-to)79-90
Number of pages12
JournalIEEE Transactions on Computers
VolumeC-33
Issue number1
DOIs
StatePublished - Jan 1984
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

Keywords

  • Detection probability
  • fault coverage
  • random patterns
  • self test
  • signal probability

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