Abstract
A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using full-fault simulation does not seem attractive because of the logic structure volume, and the CPU time encountered. A new approach is therefore necessary. This paper describes a new analytical method of computing the fault coverage that is fast compared with simulation. If the fault coverage falls below a certain threshold, it is possible to identify the “random-pattern-resistant” faults, modify the logic to make them easy to detect, and thus, increase the fault coverage of the random test.
Original language | English (US) |
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Pages (from-to) | 79-90 |
Number of pages | 12 |
Journal | IEEE Transactions on Computers |
Volume | C-33 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1984 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Software
- Theoretical Computer Science
- Hardware and Architecture
- Computational Theory and Mathematics
Keywords
- Detection probability
- fault coverage
- random patterns
- self test
- signal probability