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Random Pattern Testability
Jacob Savir
, Gary S. Ditlow
, Paul H. Bardell
Research output
:
Contribution to journal
›
Article
›
peer-review
144
Scopus citations
Overview
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Dive into the research topics of 'Random Pattern Testability'. Together they form a unique fingerprint.
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Keyphrases
Fault Coverage
100%
Testability
100%
New Analytical Method
25%
Self-testing
25%
Fault Simulation
25%
Test Quality
25%
CPU Time
25%
Random Testing
25%
Random Inputs
25%
Logical Structure
25%
Brute Force Approach
25%
Computer Science
Random Pattern
100%
Fault Coverage
100%
Fault Simulation
25%
Random Test
25%
Logic Structure
25%
Engineering
Major Problem
100%
Testability
100%
Mathematics
Random Pattern
100%
Random Input
50%