RANDOM PATTERN TESTING FOR ADDRESS-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.

J. Savir, W. H. McAnney, S. R. Vecchio

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Fingerprint

Dive into the research topics of 'RANDOM PATTERN TESTING FOR ADDRESS-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.'. Together they form a unique fingerprint.

Engineering & Materials Science