Abstract
An analytical method is described for determining the random pattern testability of permanent faults in prelogic driving the data-in lines of a multiport random-access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.
Original language | English (US) |
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Title of host publication | Digest of Papers - International Test Conference |
Publisher | IEEE |
Pages | 100-105 |
Number of pages | 6 |
ISBN (Print) | 081860641X |
State | Published - 1985 |
Externally published | Yes |
Publication series
Name | Digest of Papers - International Test Conference |
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ISSN (Print) | 0743-1686 |
All Science Journal Classification (ASJC) codes
- General Engineering