An analytical method is described for determining the random pattern testability of permanent faults in prelogic driving the data-in lines of a multiport random-access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.
|Original language||English (US)|
|Title of host publication||Digest of Papers - International Test Conference|
|Number of pages||6|
|State||Published - Dec 1 1985|
|Name||Digest of Papers - International Test Conference|
All Science Journal Classification (ASJC) codes