RANDOM PATTERN TESTING FOR DATA-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.

W. H. McAnney, J. Savir, S. R. Vecchio

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

An analytical method is described for determining the random pattern testability of permanent faults in prelogic driving the data-in lines of a multiport random-access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.

Original languageEnglish (US)
Title of host publicationDigest of Papers - International Test Conference
PublisherIEEE
Pages100-105
Number of pages6
ISBN (Print)081860641X
StatePublished - Dec 1 1985
Externally publishedYes

Publication series

NameDigest of Papers - International Test Conference
ISSN (Print)0743-1686

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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