RANDOM PATTERN TESTING FOR DATA-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.

W. H. McAnney; J. Savir; S. R. Vecchio

RANDOM PATTERN TESTING FOR DATA-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.

W. H. McAnney
, J. Savir
, S. R. Vecchio

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

An analytical method is described for determining the random pattern testability of permanent faults in prelogic driving the data-in lines of a multiport random-access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.

Original language	English (US)
Title of host publication	Digest of Papers - International Test Conference
Publisher	IEEE
Pages	100-105
Number of pages	6
ISBN (Print)	081860641X
State	Published - 1985
Externally published	Yes

Publication series

Name	Digest of Papers - International Test Conference
ISSN (Print)	0743-1686

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

@inproceedings{009b40f300b84f0992189b00bfa03bc4,

title = "RANDOM PATTERN TESTING FOR DATA-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.",

abstract = "An analytical method is described for determining the random pattern testability of permanent faults in prelogic driving the data-in lines of a multiport random-access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.",

author = "McAnney, \{W. H.\} and J. Savir and Vecchio, \{S. R.\}",

year = "1985",

language = "English (US)",

isbn = "081860641X",

series = "Digest of Papers - International Test Conference",

publisher = "IEEE",

pages = "100--105",

booktitle = "Digest of Papers - International Test Conference",

}

TY - GEN

T1 - RANDOM PATTERN TESTING FOR DATA-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.

AU - McAnney, W. H.

AU - Savir, J.

AU - Vecchio, S. R.

PY - 1985

Y1 - 1985

N2 - An analytical method is described for determining the random pattern testability of permanent faults in prelogic driving the data-in lines of a multiport random-access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.

AB - An analytical method is described for determining the random pattern testability of permanent faults in prelogic driving the data-in lines of a multiport random-access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.

UR - https://www.scopus.com/pages/publications/0022329219

UR - https://www.scopus.com/pages/publications/0022329219#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:0022329219

SN - 081860641X

T3 - Digest of Papers - International Test Conference

SP - 100

EP - 105

BT - Digest of Papers - International Test Conference

PB - IEEE

ER -

RANDOM PATTERN TESTING FOR DATA-LINE FAULTS IN AN EMBEDDED MULTIPORT MEMORY.

Abstract

Publication series

All Science Journal Classification (ASJC) codes

Other files and links

Fingerprint

Cite this