Redundancy revisited

Research output: Contribution to journalArticlepeer-review


This paper shows that when it comes to complementary metal-oxide-semiconductor (CMOS) designs undetectability does not necessarily imply redundancy. The definition of redundancy is extended to account for the special behavior encountered in CMOS designs. The accuracy of the new redundancy definition has been tested on several CMOS chips and has been found to be correct.

Original languageEnglish (US)
Pages (from-to)620-624
Number of pages5
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number4
StatePublished - 1998

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering


  • Combinational redundancy
  • Stuck-faults
  • Test-pattern generation
  • Undetectability


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