Redundancy revisited

Research output: Contribution to journalArticlepeer-review

Abstract

This paper shows that when it comes to complementary metal-oxide-semiconductor (CMOS) designs undetectability does not necessarily imply redundancy. The definition of redundancy is extended to account for the special behavior encountered in CMOS designs. The accuracy of the new redundancy definition has been tested on several CMOS chips and has been found to be correct.

Original languageEnglish (US)
Pages (from-to)620-624
Number of pages5
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume6
Issue number4
DOIs
StatePublished - 1998

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Keywords

  • Combinational redundancy
  • Stuck-faults
  • Test-pattern generation
  • Undetectability

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