Redundancy revisited

Research output: Contribution to conferencePaperpeer-review

Abstract

This paper shows that when it comes to CMOS designs undetectability does not necessarily imply redundancy. The definition of redundancy is extended to account for the special behavior encountered in CMOS designs. The accuracy of the new redundancy definition has been tested on several CMOS chips and has been found to be correct.

Original languageEnglish (US)
Pages407-412
Number of pages6
StatePublished - Jan 1 1998
EventProceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) - St.Paul, MN, USA
Duration: May 18 1998May 21 1998

Other

OtherProceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2)
CitySt.Paul, MN, USA
Period5/18/985/21/98

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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