Abstract
This paper shows that when it comes to CMOS designs undetectability does not necessarily imply redundancy. The definition of redundancy is extended to account for the special behavior encountered in CMOS designs. The accuracy of the new redundancy definition has been tested on several CMOS chips and has been found to be correct.
| Original language | English (US) |
|---|---|
| Pages | 407-412 |
| Number of pages | 6 |
| State | Published - 1998 |
| Event | Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) - St.Paul, MN, USA Duration: May 18 1998 → May 21 1998 |
Other
| Other | Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) |
|---|---|
| City | St.Paul, MN, USA |
| Period | 5/18/98 → 5/21/98 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering